{"id":338391,"date":"2025-11-07T18:39:59","date_gmt":"2025-11-07T18:39:59","guid":{"rendered":"https:\/\/www.evearly.news\/en\/teradyne-unveils-new-ets-800-automated-test-system-for-power-semiconductors\/"},"modified":"2025-11-07T18:39:59","modified_gmt":"2025-11-07T18:39:59","slug":"teradyne-unveils-new-ets-800-automated-test-system-for-power-semiconductors","status":"publish","type":"post","link":"https:\/\/www.evearly.news\/en\/teradyne-unveils-new-ets-800-automated-test-system-for-power-semiconductors\/","title":{"rendered":"Teradyne unveils new ETS-800 automated test system for \u00a0power semiconductors"},"content":{"rendered":"<p><img src='https:\/\/www.evearly.news\/en\/wp-content\/uploads\/sites\/7\/2025\/11\/teradyne-unveils-new-ets-800-automated-test-system-for-power-semiconductors.jpg' alt='' ><br \/>Automated semiconductor test equipment firm Teradyne has launched the ETS-800 D20, the latest addition to its ETS-800 platform of high-performance test systems for power semiconductors. The Teradyne ETS-800 D20 has the flexibility to scale from low to high volume as device requirements grow. The new configuration is a dual-sector test head system that provides a&#8230;   <a href=https:\/\/chargedevs.com\/newswire\/teradyne-unveils-new-ets-800-automated-test-system-for-power-semiconductors\/ target=bwindow>Read more&#8230;<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"<p><img src='https:\/\/www.evearly.news\/en\/wp-content\/uploads\/sites\/7\/2025\/11\/teradyne-unveils-new-ets-800-automated-test-system-for-power-semiconductors.jpg' alt=''><br \/>Automated semiconductor test equipment firm Teradyne has launched the ETS-800 D20, the latest addition to its ETS-800 platform of high-performance test systems for power semiconductors. The Teradyne ETS-800 D20 has the flexibility to scale from low to high volume as device requirements grow. The new configuration is a dual-sector test head system that provides a&#8230;  <\/p>\n<p> <a class=\"continue-reading-link\" href=\"https:\/\/www.evearly.news\/en\/teradyne-unveils-new-ets-800-automated-test-system-for-power-semiconductors\/\"><\/a><\/p>\n","protected":false},"author":28,"featured_media":338392,"comment_status":"closed","ping_status":"open","sticky":false,"template":"Default","format":"standard","meta":{"footnotes":""},"categories":[11],"tags":[],"class_list":["post-338391","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-charged-evs"],"_links":{"self":[{"href":"https:\/\/www.evearly.news\/en\/wp-json\/wp\/v2\/posts\/338391","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.evearly.news\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.evearly.news\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.evearly.news\/en\/wp-json\/wp\/v2\/users\/28"}],"replies":[{"embeddable":true,"href":"https:\/\/www.evearly.news\/en\/wp-json\/wp\/v2\/comments?post=338391"}],"version-history":[{"count":0,"href":"https:\/\/www.evearly.news\/en\/wp-json\/wp\/v2\/posts\/338391\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.evearly.news\/en\/wp-json\/wp\/v2\/media\/338392"}],"wp:attachment":[{"href":"https:\/\/www.evearly.news\/en\/wp-json\/wp\/v2\/media?parent=338391"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.evearly.news\/en\/wp-json\/wp\/v2\/categories?post=338391"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.evearly.news\/en\/wp-json\/wp\/v2\/tags?post=338391"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}